Beth Raff-fly.jpg
Microscopy Facility
Included in this facility are transmission and scanning electron microscopes. This lab is supervised by Barry Stein.
Phone: (812) 855-7424
Fax: (812) 855-6082
Email: bstein@indiana.edu
Transmission Electron Microscope (JEOL JEM1010)
The microscopy facility features a new JEOL JEM-1010 transmission electron microscope with a magnification range of x50 – x500K and an accelerating voltage range of 40KV – 100KV. This electron microscope provides an excellent means for t he ultrastructural analysis of biological samples, but it is also capable of selected area electron diffraction. Other features include a tilting goniometer sample stage for electron diffraction and 3-D imaging, a minimum exposure operation mode to preven t electron beam damage to fragile samples and a measurement function for the quantification of lengths and areas of structures within samples. The computer aided – menu driven operation makes it extremely user friendly. The facility also provides a staff EM technician who is responsible for maintaining the facility and for providing technical support and training for users.
Scanning Electron Microscope (JEOL JSM-5800LV)
The JSM-5800LV will operate at either high or at low vacuum allowing for the observation of samples with a high water content or low conductivity. The magnification range is from 18x to 300,000x. Resolution is 3.5nm at high vacuum and 5.5nm in low vacuum mode. Samples up to 8 inches in diameter can be viewed. Images can be recorded by 4×5 inch Polaroid or regular film, or digitized. Accelerating voltages of 0.3 to 30 KV are available.
Sample Preparation: Leica Ultracut T Ultramicrotome, Sorvall Porter-Blum MT 2B, Denton DV502 Vacuum Evaporator, Balzers Critical Point Dryer, Polaron Sputter Coater, and all other standard prep. equipment.